Radar absorbing materials based on titanium thin film obtained by sputtering technique

Journal Of Aerospace Technology And Management

Endereço:
Pr Mal Eduardo Gomes, 50
São José dos Campos / SP
Site: http://www.jatm.com.br
Telefone: (12) 3947-5115
ISSN: 19849468
Editor Chefe: Francisco Cristóvão Lourenço de Melo
Início Publicação: 31/05/2009
Periodicidade: Quadrimestral
Área de Estudo: Engenharia aeroespacial

Radar absorbing materials based on titanium thin film obtained by sputtering technique

Ano: 2011 | Volume: 3 | Número: 3
Autores: Soethe, V. L., Nohara, E. L., Fontana, L. C., Rezende, M. C.
Autor Correspondente: Soethe, V. L. | [email protected]

Palavras-chave: radar absorbing material, magnetron sputtering, thin film, titanium.

Resumos Cadastrados

Resumo Inglês:

Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties.